The VariGATR™ Grazing Angle ATR accessory is designed for enhanced analysis of monolayers on semiconductor and metallic substrates. It features a variable incident angle adjustable from 60º to 65º, allowing optimal angle selection to maximize sensitivity for different samples.
A built-in pressure applicator with slip-clutch ensures reproducible and effective contact between the sample and the mounted Ge ATR crystal. This accessory provides rapid, repeatable measurements with at least an order of magnitude improvement in sensitivity compared to standard grazing angle methods. Additionally, it offers a fully prealigned, horizontal sampling surface for ease of use.
The VariGATR™ Grazing Angle ATR accessory is designed for enhanced analysis of monolayers on semiconductor and metallic substrates. It features a variable incident angle adjustable from 60º to 65º, allowing optimal angle selection to maximize sensitivity for different samples.
A built-in pressure applicator with slip-clutch ensures reproducible and effective contact between the sample and the mounted Ge ATR crystal. This accessory provides rapid, repeatable measurements with at least an order of magnitude improvement in sensitivity compared to standard grazing angle methods. Additionally, it offers a fully prealigned, horizontal sampling surface for ease of use.
