NIR Transflectance Reference (900 – 2600 nm)

PRODUCT SHEET

NIR Transflectance Reference (900 – 2600 nm)

This reference material is specifically developed for the wavelength qualification of near-infrared reflectance spectrophotometers over a spectral range of 900 nm to 2600 nm. It employs a proprietary organic matrix (TS5) sealed by heat fusion within a far-UV quality quartz cell to ensure stability and spectral integrity.

The system utilizes a 5 mm mirror-coated cell to emulate reflectance measurements, effectively providing a 10 mm path length. This design supports consistent and reliable wavelength calibration for applications such as food product analysis where near-infrared reflectance spectroscopy is extensively used.

Features and Purposes

Spectral range: 900 nm to 2600 nm for wavelength qualification
Proprietary organic matrix (TS5) sealed in a far-UV quartz cell
5 mm mirror-coated cell simulating reflectance with an effective 10 mm path-length
Contains 14 certified peak wavelengths for calibration purposes: approximately 991, 1155, 1447, 1652, 1693, 1861, 1948, 2060, 2111, 2248, 2353, 2373, 2385, and 2536 nm
Certified peak values provided at multiple spectral bandwidths: 1.00, 2.00, 3.00, 4.00, and 5.00 nm
Calibration certificates supplied with each unit for traceable instrument qualification
Custom certified values available upon request for other wavelengths and bandwidths

DOCUMENTS AND RESOURCES

Certified Reference Materials for Spectroscopy

Starna Cell Catalogue Micro Rectangular Cells and General Specifications

NIR Transflectance Reference for Spectrophotometer Wavelength Qualification 900 to 2600 nm

PRODUCT SHEET